CPV: 38512000
6 notices found
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Electron Microscopy (Sem) System Coupled To A Focused Ion Beam (Fib)
Buyer : ENS Paris-Saclay
Create/Change Date : 2024-04-22 21:24:42 Countries : [France]
Deadline : 2024-05-21 00:00:00 Type : Invitation for Bids
Original Language : French
Estimated Value : 0 EUR View Details
Electron Microscopy (Sem) System Coupled To A Focused Ion Beam (Fib)
Buyer : Tribunal administratif de Versailles
Create/Change Date : 2024-04-22 21:24:05 Countries : [France]
Deadline : 2024-05-21 00:00:00 Type : Invitation for Bids
Original Language : French
Estimated Value : 0 View Details
Maintenance Of Microscopes In Workshop No. 08 And Organization Of Verification Of Siams Solid Body Microstructure Fragment Analyzers.
Buyer : JOINT STOCK COMPANY "CHEPETSK MECHANICAL PLANT"
Create/Change Date : 2024-04-04 18:21:15 Countries : [Russia]
Deadline : 2024-05-29 00:00:00 Type : Invitation for Bids
Original Language : Russian
Estimated Value : 54504000 RUB View Details
Focused Ion Beam Microscopes
Buyer : United Kingdom Atomic Energy Authority
Create/Change Date : 2024-04-15 11:28:58 Countries : [United Kingdom]
Deadline : 2024-07-25 00:00:00 Type : Procurement Plan
Original Language : English
Estimated Value : 0 GBP View Details
Surgical And Procedural Microscopes Dps
Buyer : HUS Group
Create/Change Date : 2023-07-19 16:21:27 Countries : [Finland]
Deadline : 2026-12-31 00:00:00 Type : Invitation for Bids
Original Language : Finnish
Estimated Value : View Details